ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

When creating a manufacturing test set for digital designs on technology feature sizes of 130 nm and smaller, it's important to include at-speed tests. Stuckat tests have been used for many years and ...

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...