Check out the full article here: https://www.oejournal.org/oea/article/doi/10.29026/oea.2025.240299 In contrast, non-interferometric methods—such as structured ...

The measurement of density is necessary for the manufacture of many of today’s products. It is an extremely valuable and reliable tool to characterize the structure and quality of solid materials ...

The mode transition of combined-cycle inlets, governed by sidewall constraints, is inherently characterized by significant ...

Competition is heating up in the atomic force microscopy (AFM) market, where several vendors are shipping new AFM systems that address various metrology challenges in packaging, semiconductors and ...

When it comes to creating miniature parts, innovative cutting and machining processes continually make more intricate features and precise geometries possible. Although advanced machining can create ...